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A 3.6-GHz Type-II Sampling PLL With a Differential Parallel-Series Double-Edge S-PD Scoring 43.1-fsRMSJitter, −258.7-dB FOM, and −75.17-dBc Reference Spur

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This article presents a low-jitter and low-spur type-II sampling phase-locked loop (S-PLL). The innovative introduction of a differential parallel-series double-edge sampling phase detector (S-PD) achieves a high phase-detection gain and… Click to show full abstract

This article presents a low-jitter and low-spur type-II sampling phase-locked loop (S-PLL). The innovative introduction of a differential parallel-series double-edge sampling phase detector (S-PD) achieves a high phase-detection gain and reduces the S-PLL in-band phase noise (PN). Incorporating a transformer-based harmonic-rich shaping voltage-controlled oscillator (VCO), the proposed S-PLL prototyped in a 65-nm CMOS, operates at 3.6 GHz and scores an integrated jitter of 43.1 fsrms integrated from 1 kHz to 100 MHz, it also exhibits a jitter-power figure-of-merit (FOM) of −258.7 dB. The measured reference (REF) spur is −80.34 dBc at $f_{\mathrm {REF}}$ and −75.17 dBc at $2f_{\mathrm {REF}}$ , respectively.

Keywords: differential parallel; double edge; series double; parallel series; inline formula; type sampling

Journal Title: IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Year Published: 2023

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