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The in situ measurement and control of the direction and magnitude of the magnetic field is demonstrated within the sample plane of a low-temperature ultra-high vacuum scanning probe microscope. These… Click to show full abstract
The in situ measurement and control of the direction and magnitude of the magnetic field is demonstrated within the sample plane of a low-temperature ultra-high vacuum scanning probe microscope. These measurements utilized electrically detected magnetic resonance magnetometry based on the spin-dependent recombination current in a conducting polymer-thin film. The presented magnetometry approach allows the absolute measurement of systematic magnetic offset fields with a resolution on the order of ≈5μT/Hz with an angular resolution below ≈1°. As the polymer film covers a macroscopic area within the sample plane, magnetometry becomes possible at various locations within the sample plane and thus the determination of magnetic field gradients.
Journal Title: Journal of Vacuum Science and Technology
Year Published: 2017
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