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A semiempirical approach to the a priori evaluation of the effect of the surface relief on the results of X-ray spectral analysis of binary compounds is proposed. Dimensionless parameter k… Click to show full abstract
A semiempirical approach to the a priori evaluation of the effect of the surface relief on the results of X-ray spectral analysis of binary compounds is proposed. Dimensionless parameter k characterizing the effect of the relief on the intensity of intrinsic X-ray radiation is determined using the experimental data obtained for reference monocrystal specimens GaAs with known geometrical parameters of the relief.
Keywords:
relief;
surface relief;
component bias;
evaluation component;
ray
Journal Title: Inorganic Materials
Year Published: 2017
Link to full text (if available)
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Journal Title: Inorganic Materials
Year Published: 2017
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!