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Fabrication and Properties of nSi–pCdTe Heterojunctions

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nSi–pCdTe heterostructures have been produced by growing a pCdTe layer on an nSi substrate using thermal evaporation in vacuum at a residual pressure of 10–3 Pa. We have studied the… Click to show full abstract

nSi–pCdTe heterostructures have been produced by growing a pCdTe layer on an nSi substrate using thermal evaporation in vacuum at a residual pressure of 10–3 Pa. We have studied the elemental concentration depth profiles across the pCdTe layer and obtained current–voltage curves and spectral characteristics of the nSi–pCdTe heterostructures.

Keywords: nsi pcdte; properties nsi; fabrication properties; pcdte heterojunctions

Journal Title: Inorganic Materials
Year Published: 2020

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