nSi–pCdTe heterostructures have been produced by growing a pCdTe layer on an nSi substrate using thermal evaporation in vacuum at a residual pressure of 10–3 Pa. We have studied the… Click to show full abstract
nSi–pCdTe heterostructures have been produced by growing a pCdTe layer on an nSi substrate using thermal evaporation in vacuum at a residual pressure of 10–3 Pa. We have studied the elemental concentration depth profiles across the pCdTe layer and obtained current–voltage curves and spectral characteristics of the nSi–pCdTe heterostructures.
               
Click one of the above tabs to view related content.