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The influence of ultrasound on the adhesion of the Ni–SmS–Ni system in thin-film thermoelectric SmS-based generators has been studied. It is found that the adhesion between the SmS film and… Click to show full abstract
The influence of ultrasound on the adhesion of the Ni–SmS–Ni system in thin-film thermoelectric SmS-based generators has been studied. It is found that the adhesion between the SmS film and conducting Ni contact pad deteriorates under ultrasound action, which leads to deterioration of the electrical parameters of generation. It is shown that the use of Cr as a sublayer between SmS and Ni improves adhesion without significant deterioration of the generation parameters.
Keywords:
ultrasound adhesion;
thin film;
adhesion;
influence ultrasound;
film;
film thermoelectric
Journal Title: Crystallography Reports
Year Published: 2020
Link to full text (if available)
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Journal Title: Crystallography Reports
Year Published: 2020
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!