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The avalanche breakdown of a p–n junction is investigated experimentally in order to study the temporal distribution of microplasma pulses. It is revealed that the observed type of microplasma noise… Click to show full abstract
The avalanche breakdown of a p–n junction is investigated experimentally in order to study the temporal distribution of microplasma pulses. It is revealed that the observed type of microplasma noise is not described by the existing model of processes occurring during the avalanche breakdown of a p–n junction. A computer model explaining the mechanisms of microplasma instability and taking into account the electric and temperature dependences of avalanche breakdown, which agrees with the experimental results, is developed using simulation modeling.
Journal Title: Semiconductors
Year Published: 2019
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