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Submicron probes for scanning electrochemical microscopy

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To improve the spatial resolutions of scanning electrochemical microscopy (SECM) imaging, the laser-pulled submicron electrode fabrication method was explored in this work. Manual polishing of a laser-pulled Pt nanoelectrode exposed… Click to show full abstract

To improve the spatial resolutions of scanning electrochemical microscopy (SECM) imaging, the laser-pulled submicron electrode fabrication method was explored in this work. Manual polishing of a laser-pulled Pt nanoelectrode exposed a Pt tip diameter of 250 nm with a ratio of the tip glass to exposed Pt disc (RG) of 30. This fabricated submicron probe was then utilized to study the electrochemical functionality of an independently addressable microband electrodes (IAME) sample using SECM. In the constant imaging mode of SECM, where the probe is scanned linearly across the sample at a fixed z position, SECM demonstrated higher resolution than that of the conventional micrometer electrodes when the feedback currents from the Pt and glass microbands were characterized. In addition, the depth scan imaging mode of SECM was also used to extract experimental horizontal line scans and probe approach curves for analysis. Three-dimensional (3D) simulations of the IAME–SECM probe experiments were explored for the fi...

Keywords: submicron probes; microscopy; scanning electrochemical; secm; electrochemical microscopy

Journal Title: Canadian Journal of Chemistry
Year Published: 2018

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