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The image dislocation method is used to construct the governing equation of dislocations in nanofilms. The classical Peierls-Nabarro equation can be recovered when the thickness of nanofilm is taken to… Click to show full abstract
The image dislocation method is used to construct the governing equation of dislocations in nanofilms. The classical Peierls-Nabarro equation can be recovered when the thickness of nanofilm is taken to be infinite. In order to determine the core width and Peierls stress of dislocations, the unstable stacking fault energies of Al and Cu nanofilms are calculated via the first-principle methods. It is found that surface effect can increase the Peierls stresses of screw dislocations in Al and Cu nanofilms.
Keywords:
surface effects;
effects properties;
dislocation;
properties screw;
dislocation nanofilms;
screw dislocation
Journal Title: Advances in Materials Science and Engineering
Year Published: 2017
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Journal Title: Advances in Materials Science and Engineering
Year Published: 2017
Link to full text (if available)
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recommendations!