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Enhanced nonparametric control charts under simple and ranked set sampling schemes

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Investigation and removal of unnatural variation in the processes of manufacturing, production and services require application of statistical process control. Control charts are the most famous and commonly used statistical… Click to show full abstract

Investigation and removal of unnatural variation in the processes of manufacturing, production and services require application of statistical process control. Control charts are the most famous and commonly used statistical process control tools to trace changes in the manufacturing and nonmanufacturing processes parameter(s). The nonparametric control charts become necessary when the distribution of underlying process is unknown or questionable. The nonparametric charts are robust alternative along with holding property of quick shift detection ability in process parameter(s). In this article, we have proposed nonparametric double exponentially weighted moving average chart based on Wilcoxon signed rank test under simple and ranked set sampling schemes for efficient monitoring of the process location. The proposed control charts are compared with classical exponentially weighted moving average, double exponentially weighted moving average, nonparametric exponentially weighted moving average sign, nonparametric exponentially weighted moving average signed rank, nonparametric cumulative sum signed rank charts using average run length and some other characteristics of run length distribution as performance measures. Comparison reveals that the proposed control charts performs better to detect all kinds of shifts in the process location than existing counterparts. A real-life application related to manufacturing process (the variable of interest is the diameter of piston ring) is also provided for the practical implementation of the proposed chart.

Keywords: control charts; control; moving average; process; exponentially weighted; weighted moving

Journal Title: Transactions of the Institute of Measurement and Control
Year Published: 2020

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