LAUSR

The product’s reliability is influenced by multiple environmental factors in the dynamic field environment. In this article, a field reliability assessment method is proposed. This method links the effects of multiple environmental factors in the dynamic field environment to the product’s reliability with the acceleration models. Three environmental modeling methods are developed taking into full consideration the variability, dependency, and randomness of the field environment. Then the three methods are applied to calculate the acceleration factor for the material exposed to the corrosive atmosphere and the time-to-whisker-nucleation for semiconductor devices, incorporating the nonlinear acceleration effects of multiple environmental factors. The results are more accurate and significantly better than conventional reliability assessment methods. The method can help to study the influence of environmental factors on the failure process and predict the product’s life and reliability in a dynamic field environment.