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This paper extends a method previously applied to the determination of the optical constants of a high-index thin film to a dielectric bilayer. This method is based on the time… Click to show full abstract
This paper extends a method previously applied to the determination of the optical constants of a high-index thin film to a dielectric bilayer. This method is based on the time recording of the spectral transmittance of the stack during its deposition with the help of an in situ broadband monitoring system.
Keywords:
monitoring system;
optical constants;
broadband monitoring;
dielectric bilayer;
determination optical
Journal Title: Applied optics
Year Published: 2018
Link to full text (if available)
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Journal Title: Applied optics
Year Published: 2018
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!