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Genetics of resistance to common root rot and dark brown leaf spot blotch (both caused by Bipolaris sorokiniana Shoem.) was studied in wheat somaclonal lines, obtained in calluses culture of… Click to show full abstract
Genetics of resistance to common root rot and dark brown leaf spot blotch (both caused by Bipolaris sorokiniana Shoem.) was studied in wheat somaclonal lines, obtained in calluses culture of samples 181-5 and Vera. Four different approaches were used: linear analysis of resistance in generations of segregating somaclonal lines, hybridological analysis, study of resistance components, study of possible durability of resistance. Results showed, that resistance to both diseases is likely controlled by polygenic systems with additive actions of minor genes. Different lines possess non-identical genetic systems for resistance. Several lines kept their initial level of resistance to spot blotch after 5 cycles of the pathogen artificial population reproduction.
Journal Title: Plant protection science
Year Published: 2018
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