LAUSR

Parental, F 1 , reciprocal F 1 (RF 1 ), F 2 , reciprocal F 2 (RF 2 ), BC 1 P 1 and BC 1 P 2 generations of four crosses involving four cultivars of durum wheat ( Triticum durum Desf.) were evaluated for grain resistance to yellow - berry. Significant differences were reported for F 1 , F 2 and their reciprocals in all crosses. A generation means analysis indicated the inadequacy of additive-dominance model and additive-dominance model considering maternal effects. However, the variation in generation means in the four crosses could be explained by a digenic epistatic model with cytoplasmic effects. Cytoplasmic effects were significant and consistent in all the crosses. Dominance effects and additive × dominance epistasis were more important than additive effects and other epistatic components. The choice of a female parent possessing grain resistance to yellowberry appeared to be decisive in durum wheat breeding for resistance to this serious seed disorder.