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Thermoluminescence Properties for X-ray of Cr-doped Al2O3 Ceramics

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We investigated the basic thermoluminescence (TL) characteristics of Cr-doped low-meltingpoint Al2O3. The concentration of Cr2O3 in this study ranged from 0.01 to 1.0 wt%. Owing to the stabilization of the… Click to show full abstract

We investigated the basic thermoluminescence (TL) characteristics of Cr-doped low-meltingpoint Al2O3. The concentration of Cr2O3 in this study ranged from 0.01 to 1.0 wt%. Owing to the stabilization of the trapped state caused by Cr doping, we successfully improved the lowmelting-point Al2O3 fading property dramatically. Then, the sensitivity of 0.05 wt% Cr-doped Al2O3 to X-rays was about 4.8 times higher than that of the nondoped Al2O3, allowing the Al2O3 to maintain its attractive properties to X-rays. Furthermore, the 0.05 wt% Cr-doped Al2O3 had good properties for dosimetry owing to its high TL sensitivity, high reproducibility, high radiation resistivity, and high thermal stability in two dimensions. Finally, we demonstrated two-dimensional (2D) verifications of radiotherapy (RT) plans using Cr-doped Al2O3 ceramic plates. The results had good agreement with RT plans.

Keywords: ray doped; thermoluminescence properties; thermoluminescence; properties ray; doped al2o3; al2o3 ceramics

Journal Title: Sensors and Materials
Year Published: 2018

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