Donggeun You 1, Hyunwoo Heo 1, Hyungseup Kim 1 , Yongsu Kwon 1, Sangmin Lee 2 and Hyoungho Ko 1,* 1 Department of Electronics Engineering, Chungnam National University, Daejeon 34134,… Click to show full abstract
Donggeun You 1, Hyunwoo Heo 1, Hyungseup Kim 1 , Yongsu Kwon 1, Sangmin Lee 2 and Hyoungho Ko 1,* 1 Department of Electronics Engineering, Chungnam National University, Daejeon 34134, Korea; [email protected] (D.Y.); [email protected] (H.H.); [email protected] (H.K.); [email protected] (Y.K.) 2 Department of Biomedical Engineering, Kyung Hee University, Yongin 17104, Korea; [email protected] * Correspondence: [email protected]; Tel.: +82-42-821-5664; Fax: +82-42-832-5436
               
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