In medicals sciences and reliability engineering, the failure of individuals or units (I/Us) occurs due to independent causes of failure. In general, the symmetry between dependent and independent causes of… Click to show full abstract
In medicals sciences and reliability engineering, the failure of individuals or units (I/Us) occurs due to independent causes of failure. In general, the symmetry between dependent and independent causes of failure is essential to the nature of the problem at hand. In this study, we considered the accelerated dependent competing risks model when the lifetime of I/Us was modeled using a generalized half-logistic distribution. The data were obtained with respect to constant stress accelerated life tests (ALTs) with a type-II progressive censoring scheme. The dependence structure was formulated using the copula approach (symmetric Archimedean copula). The model parameters were estimated with the maximum likelihood method; only two dependent causes of failure and bivariate Pareto copula functions were proposed. The approximate confidence intervals were constructed using both the asymptotic normality distribution of MLEs and bootstrap techniques. Additionally, an estimator of the reliability of the system under a normal stress level was constructed. The results from the estimation methods were tested by performing a Monte Carlo simulation study. Finally, an analysis of data sets from two stress levels was performed for illustrative purposes.
               
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