Photo by alex_andrews from unsplash
In this Letter, we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics. Specifically, due to the extended depth of field of… Click to show full abstract
In this Letter, we propose an on-line inspection method based on a plenoptic camera to detect and locate flaws of optics. Specifically, due to the extended depth of field of the plenoptic camera, a series of optics can be inspected efficiently and simultaneously. Moreover, the depth estimation capability of the plenoptic camera allows for locating flaws while detecting them. Besides, the detection and location can be implemented with a single snapshot of the plenoptic camera. Consequently, this method provides us with the opportunity to reduce the cost of time and labor of inspection and remove the flaw optics, which may lead to performance degradation of optical systems. © 2017 Chinese Optics Letters.
Journal Title: Chinese Optics Letters
Year Published: 2017
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!