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We propose time-domain reflectometry as an effective tool to investigate the dynamics of electronic devices. We use this technique to experimentally detect with 10 ns time resolution the dynamic process… Click to show full abstract
We propose time-domain reflectometry as an effective tool to investigate the dynamics of electronic devices. We use this technique to experimentally detect with 10 ns time resolution the dynamic process of carrier injection from the contact electrode into an organic thin film transistor as a time evolution of the device impedance. This method allows us to trace vertical carrier injection in the thickness direction.
Keywords:
time;
time domain;
carrier injection;
domain reflectometry
Journal Title: Applied Physics Express
Year Published: 2019
Link to full text (if available)
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Journal Title: Applied Physics Express
Year Published: 2019
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!