Atomistic structures of 〈0001〉 tilt grain boundaries in a textured Mg thin film.
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DOI: 10.1039/d2nr05505h
Abstract: Nanocrystalline Mg was sputter deposited onto an Ar ion etched Si {100} substrate. Despite an ∼6 nm amorphous layer found at the interface, the Mg thin film exhibits a sharp basal-plane texture enabled by surface… read more here.
Keywords: 0001 tilt; tilt grain; grain boundaries; thin film ... See more keywords