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1
Published in 2021 at "APL Materials"
DOI: 10.1063/5.0051340
Abstract: Chemical and electrical measurements of Ti/(010) β-Ga2O3 and Ti/(001) β-Ga2O3 interfaces were conducted as a function of annealing temperature using x-ray photoelectron spectroscopy (XPS), current density–voltage (J–V), and capacitance–voltage (C–V) measurements. XPS revealed partial Ti…
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Keywords:
001 ga2o3;
ga2o3;
analysis contacts;
electrical chemical ... See more keywords
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2
Published in 2023 at "Applied Physics Letters"
DOI: 10.1063/5.0138736
Abstract: In this study, we dry etched SiO2-masked (001) β-Ga2O3 substrates in HCl gas flow at a high temperature without plasma excitation. The etching was done selectively in window areas to form holes or trenches with…
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Keywords:
hcl gas;
ga2o3 substrates;
001 ga2o3;
dry etching ... See more keywords
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3
Published in 2023 at "APL Materials"
DOI: 10.1063/5.0142746
Abstract: Phase pure β-(AlxGa1−x)2O3 thin films are grown on (001) oriented β-Ga2O3 substrates via metalorganic chemical vapor deposition. By systematically tuning the precursor molar flow rates, the epitaxial growth of coherently strained β-(AlxGa1−x)2O3 films is demonstrated…
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Keywords:
alxga1 2o3;
2o3 thin;
ga2o3 substrates;
001 ga2o3 ... See more keywords
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0
Published in 2024 at "Applied Physics Express"
DOI: 10.35848/1882-0786/ad5bbe
Abstract: We have found microgrooves on the (001) β-Ga2O3 epitaxial deposited by halide vapor-phase epitaxy in Schottky barrier diodes to be killer defects at the point of reverse leakage-current flow [−10.0 μA at −64 V]. The…
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Keywords:
topography;
schottky barrier;
001 ga2o3;
reverse leakage ... See more keywords