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Published in 2019 at "IEEE Transactions on Nuclear Science"
DOI: 10.1109/tns.2019.2903982
Abstract: This paper presents a study of the noise behavior of MOSFET devices belonging to a 110-nm CMOS technology in view of applications to the design of low-noise, low-power analog circuits in X-ray detection at free…
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Keywords:
science;
technology;
cmos technology;
noise ... See more keywords
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Published in 2022 at "Optics express"
DOI: 10.1364/oe.455513
Abstract: This paper presents the effect of shallow trench isolation (STI) on the dark count rate (DCR) and after-pulsing probability (APP) of deep-junction-based single-photon avalanche diodes (SPADs). Two different SPADs were fabricated in 110 nm CMOS…
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Keywords:
110 cmos;
avalanche diodes;
single photon;
photon avalanche ... See more keywords