Growth and characterization of Ag layers on Mo(110) using LEED, XPS and ARPES
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DOI: 10.1007/s12648-025-03605-0
Abstract: Epitaxial ultra-thin film systems present unique properties distinct from their bulk counterparts, influenced by strain, morphology, defects, and substrate conditions. The Ag/Mo(110) system, where silver adopts a face-centred cubic (fcc) structure on a body-centred cubic… read more here.
Keywords: spectroscopy; using leed; growth characterization; 110 using ... See more keywords