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Published in 2017 at "Crystallography Reports"
DOI: 10.1134/s1063774517050121
Abstract: Thin Ga2Se3 layers deposited on silicon substrates with the (100), (111), and (123) orientations are studied by transmission electron microscopy and X-ray microanalysis. Some features and regularities of the stoichiometric gallium vacancy ordering at different…
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Keywords:
100 111;
ordering ga2se3;
111 123;
gallium vacancy ... See more keywords