Total Dose Effects on Voltage References in 130-nm CMOS Technology
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DOI: 10.1109/tdmr.2017.2787906
Abstract: This paper investigates the impact of total ionizing dose (TID) effects on the performance of CMOS voltage reference circuits. Four circuits were designed using a commercial 130-nm CMOS process and without any radiation-hardening technique. Two… read more here.
Keywords: voltage; total dose; 130 cmos; output voltage ... See more keywords