Impact of Series Resistance on Bulk CMOS Current Matching Over the 5–300K Temperature Range
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DOI: 10.1109/led.2017.2709545
Abstract: This letter presents the impact of source/drain series resistance on the matching of bulk nMOS and pMOS field-effect transistor current over the 5–300K temperature range. A new method to extract series resistance is introduced, and… read more here.
Keywords: series; temperature range; 300k temperature; series resistance ... See more keywords