Investigation of microstructure and electrical properties of Sm doped ceria thin films
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DOI: 10.1016/j.ssi.2016.11.007
Abstract: Abstract Sm0.2Ce0.8O2 − δ (SDC) thin films (~ 1.9 μm) were deposited on SiO2, Alloy 600 (Fe-Ni-Cr), and Al2O3 substrates, using e-beam evaporation technique. The deposition rate was 0.2 nm/s ÷ 1.6 nm/s, and substrate temperature during the formation of thin films was… read more here.
Keywords: 723 873; thin films; substrate temperatures; substrate temperature ... See more keywords