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Published in 2019 at "International Journal of Electronics"
DOI: 10.1080/00207217.2019.1600738
Abstract: ABSTRACT CMOS (Complementary Metal-oxide-semiconductor) based high-speed applications in the sub-14 nm technology node using InGaAs Fin field-effect-transistors (FinFETs) confront with inevitable effect in form of interface traps upon integration of dielectric layer with InGaAs material.…
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Keywords:
in0 52al0;
52al0 48as;
layer;
cap layer ... See more keywords