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Published in 2019 at "Surface and Interface Analysis"
DOI: 10.1002/sia.6682
Abstract: In this work, scanning electrochemical microscopy (SECM) measurements were employed to characterize the electrochemical activities on polished and as‐received surfaces of the 2098‐T351 aluminum alloy (AA2098‐T351). The effects of the near surface deformed layer (NSDL)…
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Keywords:
scanning electrochemical;
electrochemical microscopy;
aa2098 t351;
microscopy ... See more keywords