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   Articles with "aberration corrected" as a keyword



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Application of aberration‐corrected scanning transmission electron microscopy in conjunction with valence electron energy loss spectroscopy for the nanoscale mapping of the elastic properties of Al–Li–Cu alloys

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recommendations! Published in 2020 at "Microscopy Research and Technique"

DOI: 10.1002/jemt.23646

Abstract: The stress and strain play an important role in strengthening of the precipitation‐hardened Aluminum (Al) alloys. Despite the determination of relationship between the mechanical properties and the precipitation existing in the microstructure of these alloys,… read more here.

Keywords: corrected scanning; energy; microscopy; aberration corrected ... See more keywords

Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy

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recommendations! Published in 2024 at "Small Methods"

DOI: 10.1002/smtd.202301425

Abstract: Aberration‐corrected scanning transmission electron microscopy (STEM) has been advancing resolution, sensitivity, and microanalysis due to the intense demands of atomic‐level microstructural investigations. Recent STEM technologies require preparing a thin lamella whose thickness is ideally below… read more here.

Keywords: methodology; electron microscopy; lamella; thickness ... See more keywords

Exploring the atomic structure of 1.8nm monolayer-protected gold clusters with aberration-corrected STEM.

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recommendations! Published in 2017 at "Ultramicroscopy"

DOI: 10.1016/j.ultramic.2016.11.021

Abstract: Monolayer-protected (MP) Au clusters present attractive quantum systems with a range of potential applications e.g. in catalysis. Knowledge of the atomic structure is needed to obtain a full understanding of their intriguing physical and chemical… read more here.

Keywords: aberration corrected; atomic structure; monolayer protected; structure ... See more keywords

Aberration-corrected scanning transmission electron microscopy in single-atom catalysis: Probing the catalytically active centers

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recommendations! Published in 2017 at "Chinese Journal of Catalysis"

DOI: 10.1016/s1872-2067(17)62900-0

Abstract: Aberration-corrected scanning transmission electron microscopy techniques are indispensable for understanding catalysis by supported single metal atoms and for developing practical single-atom catalysts for energy and chemical transformations. read more here.

Keywords: corrected scanning; microscopy; catalysis; aberration corrected ... See more keywords
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Aberration-Corrected STEM/EELS at Cryogenic Temperatures

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recommendations! Published in 2017 at "Microscopy and Microanalysis"

DOI: 10.1017/s1431927617002823

Abstract: Today’s aberration-corrected scanning transmission electron microscopes (STEM) routinely focus highenergy electrons down to a spot smaller than 1Å in diameter to perform scattering experiments that allow us to study the atomic-scale structure of materials and… read more here.

Keywords: aberration; corrected stem; cryogenic temperatures; aberration corrected ... See more keywords
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From Atoms To Functional Nanomaterials; Structural Modifications As Observed Using Aberration-Corrected STEM

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recommendations! Published in 2017 at "Microscopy and Microanalysis"

DOI: 10.1017/s1431927617009977

Abstract: For over a decade aberration-corrected scanning transmission electron microscopy (AC-STEM) has proven essential in the study of nanomaterials. Nanomaterials are essentially assemblies of atoms arranged in such a way that they can serve a myriad… read more here.

Keywords: structural modifications; microscopy; aberration corrected; stem ... See more keywords

Probing The Mechanical Properties of Few-Layer Graphene with Aberration-Corrected, Low-Voltage STEM

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recommendations! Published in 2019 at "Microscopy and Microanalysis"

DOI: 10.1017/s1431927619009383

Abstract: Understanding the deformability, flexibility, and bending mechanics of two-dimensional (2D) materials is critical for the realization of next-generation deformable electronics and nanomechanical devices. While the mechanics of few-layer graphene have been studied for more than… read more here.

Keywords: microscopy; layer graphene; stem; aberration corrected ... See more keywords

Aberration-Corrected STEM Analysis of Impurities in Cosmic Nanodiamonds and Synthetic Analogs

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recommendations! Published in 2019 at "Microscopy and Microanalysis"

DOI: 10.1017/s1431927619009413

Abstract: Nanodiamond is an important material in planetary materials research because it was the first mineral phase identified as identified as the carrier of products of supernova nucleosynthesis pre-dating the formation of the Solar System [1],… read more here.

Keywords: microscopy; corrected stem; analysis impurities; aberration corrected ... See more keywords

Real-Time Imaging of Surface Dynamics on CeO2 Nanoparticles using Time-Resolved Aberration-Corrected TEM

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recommendations! Published in 2019 at "Microscopy and Microanalysis"

DOI: 10.1017/s1431927619010985

Abstract: Oxygen exchange on CeO2 (ceria) nanoparticle surfaces is often the rate limiting step in technological applications [1], and a nanoparticle’s shape, size, surface composition, and surface atomic arrangement can all influence catalytic activity, meaning that… read more here.

Keywords: time resolved; time; surface; corrected tem ... See more keywords
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Quasi-static 3D structure of graphene ripple measured using aberration-corrected TEM.

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recommendations! Published in 2021 at "Nanoscale"

DOI: 10.1039/d1nr00237f

Abstract: Free-standing graphene has a three-dimensional (3D) structure, called a ripple, rather than a perfect two-dimensional (2D) crystal. Since theoretical calculations suggest that a ripple strongly influences various fundamental physicochemical properties of graphene, it is important… read more here.

Keywords: ripple; using aberration; graphene; aberration corrected ... See more keywords

Atomic-level quantitative analysis of electronic functional materials by aberration-corrected STEM

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recommendations! Published in 2024 at "Chinese Physics B"

DOI: 10.1088/1674-1056/ad7afc

Abstract: The stable sub-angstrom resolution of the aberration-corrected scanning transmission electron microscope (AC-STEM) makes it an advanced and practical characterization technique for all materials. Owing to the prosperous advancement in computational technology, specialized software and programs… read more here.

Keywords: quantitative analysis; functional materials; analysis; electronic functional ... See more keywords