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Published in 2018 at "Nano letters"
DOI: 10.1021/acs.nanolett.8b02718
Abstract: Imaging the complete atomic structure of materials, including light elements, with minimal beam-induced damage of the sample is a long-standing challenge in electron microscopy. Annular bright-field scanning transmission electron microscopy is often used to image…
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Keywords:
microscopy;
electron ptychography;
electron;
aberration free ... See more keywords
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Published in 2019 at "Physical review letters"
DOI: 10.1103/physrevlett.122.129901
Abstract: This corrects the article DOI: 10.1103/PhysRevLett.121.194801.
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Keywords:
preservation aberration;
121 194801;
emittance preservation;
aberration free ... See more keywords
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Published in 2019 at "Journal of synchrotron radiation"
DOI: 10.1107/s160057751801576x
Abstract: An extreme-ultraviolet (XUV) double-stage Raman spectrometer is permanently installed as an experimental end-station at the PG1 beamline of the soft X-ray/XUV free-electron laser in Hamburg, FLASH. The monochromator stages are designed according to the Czerny-Turner…
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Keywords:
flash;
aberration free;
raman spectrometer;
xuv ... See more keywords
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Published in 2020 at "Optics letters"
DOI: 10.1364/ol.392947
Abstract: In this Letter, we present a new, to our knowledge, aberration-free 3D imaging technique based on digital micromirror device (DMD)-based two-photon microscopy and sensorless adaptive optics (AO), where 3D random-access scanning and modal wavefront correction…
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Keywords:
microscopy;
two photon;
optics;
imaging ... See more keywords
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Published in 2022 at "Optics letters"
DOI: 10.1364/ol.460947
Abstract: Laser stealth dicing can realize material separation with negligible surface damage, but severe aberrations in thick materials degrade processing quality. This Letter presents a nonlinear point-to-point transformation method combined with spherical aberration compensation to achieve…
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Keywords:
aberration;
stealth dicing;
aberration free;
free axial ... See more keywords