Optimal Accelerated Test Framework for Time-Dependent Dielectric Breakdown Lifetime Parameter Estimation
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DOI: 10.1109/tvlsi.2020.3017950
Abstract: A framework is presented to identify an optimal accelerated test region and accelerated test conditions for the accelerated test of logic circuits for time-dependent dielectric breakdown (TDDB). Both gate-oxide breakdown and middle-of-line (MOL) TDDB are… read more here.
Keywords: test; test conditions; accelerated test; optimal accelerated ... See more keywords