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Published in 2017 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927617009801
Abstract: Energy dispersive X-ray spectroscopy (EDS) and/or electron energy-loss spectroscopy (EELS) in scanning transmission electron microscopy (STEM) is very popular for analysis of semiconductor devices, since we require chemical information of them other than their shapes…
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Keywords:
microscopy;
beam drilling;
spectroscopy;
electron beam ... See more keywords
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Published in 2017 at "Journal of Microscopy"
DOI: 10.1111/jmi.12591
Abstract: Characterising the impact of lithium additions in the precipitation sequence in Al–Li–Cu alloys is important to control the strengthening of the final material. Since now, transmission electron microscopy (TEM) at high beam voltage has been…
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Keywords:
voltage;
contrast;
microscopy;
field ... See more keywords
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Published in 2020 at "Scanning"
DOI: 10.1155/2020/3743267
Abstract: In this study, the effect of Scanning Electron Microscopy (SEM) parameters such as magnification (M), accelerating voltage (V), and working distance (WD) on the 3D digital reconstruction technique, as the first step of the quantitative…
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Keywords:
reconstruction;
distance;
magnification;
accelerating voltage ... See more keywords
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Published in 2022 at "Materials"
DOI: 10.3390/ma15051878
Abstract: The electron beam powder bed fusion (EB-PBF) process is typically carried out using a layer thickness between 50 and 100 μm with the accelerating voltage of 60 kV for the electron beam. This configuration ensures…
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Keywords:
electron beam;
layer thickness;
accelerating voltage;
thickness ... See more keywords