Challenges in quantitative crystallographic characterization of 3D thin films by ACOM-TEM.
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DOI: 10.1016/j.ultramic.2016.07.007
Abstract: Automated crystal orientation mapping for transmission electron microscopy (ACOM-TEM) has become an easy to use method for the investigation of crystalline materials and complements other TEM methods by adding local crystallographic information over large areas.… read more here.
Keywords: thin films; microscopy; challenges quantitative; quantitative crystallographic ... See more keywords