Scan Rate Adaptation for AFM Imaging Based on Performance Metric Optimization
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DOI: 10.1109/tmech.2019.2947203
Abstract: Constant-force contact-mode atomic force microscopy (AFM) relies on a feedback control system to regulate the tip–sample interaction during imaging. Due to limitations in actuators and control, the bandwidth of the regulation system is typically small.… read more here.
Keywords: scan rate; performance; afm imaging; rate ... See more keywords