A Self-Adaptive SEU Mitigation Scheme for Embedded Systems in Extreme Radiation Environments
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DOI: 10.1109/jsyst.2022.3144019
Abstract: When electronic systems are working in radiation environments, transient errors, and permanent errors may occur. Static random-access memory (SRAM) has been the one of most significant parts in various semiconductor chips for its high performance… read more here.
Keywords: radiation environments; extreme radiation; adaptive seu; self adaptive ... See more keywords