Sample preparation for aberration-corrected microscopy of high-quality TEM specimens of advanced integrated circuits
Sign Up to like & getrecommendations! Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618001241
Abstract: Advanced integrated circuits (ICs) are complex due to the fin field effect transistors (FinFETs), which comprise multigate transistors with the source/drain (S/D) channels (fins) surrounded by a threedimensional gate. State-of-the-art ICs are at the 10… read more here.
Keywords: integrated circuits; microscopy; advanced integrated; sample preparation ... See more keywords
Estimation and Analysis of Higher-Order Harmonics in Advanced Integrated Circuits to Implement Noise-Free Future-Generation Micro- and Nanoelectromechanical Systems
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DOI: 10.3390/mi12050541
Abstract: This work deals with the analysis of spectrum generation from advanced integrated circuits in order to better understand how to suppress the generation of high harmonics, especially in a given frequency band, to design and… read more here.
Keywords: order; advanced integrated; higher order; generation ... See more keywords