Surface and build‐up dose comparison between Elekta 6 MV flattening filter and flattening‐filter‐free beams using an advanced Markus ionization chamber and a solid water‐equivalent phantom
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DOI: 10.1002/acm2.13094
Abstract: Abstract Using a plane‐parallel advanced Markus ionization chamber and a stack of water‐equivalent solid phantom blocks, percentage surface and build‐up doses of Elekta 6 MV flattening filter (FF) and flattening‐filter‐free (FFF) beams were measured as… read more here.
Keywords: advanced markus; phantom; flattening filter; fff ... See more keywords