Recent advances in oblique plane microscopy
Sign Up to like & getrecommendations! Published in 2023 at "Nanophotonics"
DOI: 10.1515/nanoph-2023-0002
Abstract: Abstract Oblique plane microscopy (OPM) directly captures object information in a plane tilted from the focal plane of the objective lens without the need for slow z-stack acquisition. This unconventional widefield imaging approach is made… read more here.
Keywords: plane microscopy; microscopy; oblique plane; plane ... See more keywords