'Hi-Fi AFM': high-speed contact mode atomic force microscopy with optical pickups
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DOI: 10.1088/1361-6501/aad771
Abstract: High-speed atomic force microscopy (HS-AFM) is a powerful emerging tool used to gain insight into real-time nanoscale dynamics and phenomena across the sciences. By performing measurements of material properties, abundancy counting and dimensional analysis, it… read more here.
Keywords: afm high; microscopy; contact mode; force microscopy ... See more keywords