Fabrication of none-ridge nanogrooves with large-radius probe on PMMA thin-film using AFM tip-based dynamic plowing lithography approach
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Manufacturing Processes"
DOI: 10.1016/j.jmapro.2017.07.016
Abstract: Abstract In this study, the AFM tip-based dynamic plowing lithography (DPL) method is utilized to conduct nanoscratching tests on the poly(methyl methacrylate) (PMMA) thin-film surface. Aim to fabricate none-ridge nanogrooves, a relatively large-radius probe in… read more here.
Keywords: ridge nanogrooves; none ridge; afm tip; tip based ... See more keywords
Atomic Force Microscopy (AFM) Analysis of an Object Larger and Sharper than the AFM Tip
Sign Up to like & getrecommendations! Published in 2019 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927619014697
Abstract: Abstract Atomic force microscopy (AFM) is typically used for analysis of relatively flat surfaces with topographic features smaller than the height of the AFM tip. On flat surfaces, it is relatively easy to find the… read more here.
Keywords: microscopy; afm tip; afm; sharper afm ... See more keywords
AFM-tip written normal and anomalous domains in PMN-0.4PT crystals
Sign Up to like & getrecommendations! Published in 2019 at "Journal of Applied Physics"
DOI: 10.1063/1.5092569
Abstract: At present, crystals of the solid solutions Pb(Mg1/3Nb2/3)O3-xPbTiO3 (PMN-xPT) are under intensive investigation due to their excellent piezoelectric characteristics. Studies in domain engineering are of importance for an insight into the contribution from the domain… read more here.
Keywords: anomalous domains; pmn 4pt; poling field; afm tip ... See more keywords
AFM Tip Localization and Efficient Scanning Method for MEMS Inspection
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Instrumentation and Measurement"
DOI: 10.1109/tim.2022.3175250
Abstract: Atomic force microscopy (AFM) is widely used in different fields, such as nanotechnology, semiconductor, microelectromechanical systems (MEMSs), bioscience, and so on. In the case of obtaining the 3-D topography of a large-scale MEMS sample, it… read more here.
Keywords: localization; scanning method; tip localization; afm tip ... See more keywords