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Published in 2020 at "IEEE Computer Architecture Letters"
DOI: 10.1109/lca.2020.3040326
Abstract: As transistor dimensions continue to shrink, long-term reliability threats, such as Negative Bias Temperature Instability, affect multicore processors lifespan. This letter proposes a load balancing technique, based on the rate of integer and floating-point instructions…
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Keywords:
context switching;
aging aware;
multicore processors;
multicore ... See more keywords
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Published in 2023 at "IEEE Transactions on Circuits and Systems II: Express Briefs"
DOI: 10.1109/tcsii.2022.3212123
Abstract: With transistor scaling to nanometer region, aging effects become a non-neglectable issue in circuit design. Aging-aware standard cell library is necessary for robust circuit design. To consider aging effects in standard cell libraries, existing methods…
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Keywords:
sensitivity analysis;
cell library;
standard cell;
aging aware ... See more keywords