CacheEM: For Reliability Analysis on Cache Memory Aging Due to Electromigration
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2021.3121636
Abstract: Electromigration (EM) is crucial for interconnect reliability. This article introduces the implementation and application of CacheEM which targets SRAM cache memory aging due to EM. CacheEM is based on a comprehensive framework including five parts:… read more here.
Keywords: aging due; memory; electromigration; cache memory ... See more keywords