A Novel Online Chip-Related Aging Monitoring Method for IGBTs Based on the Leakage Current
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DOI: 10.1109/tie.2022.3163516
Abstract: Online aging monitoring is the basis for high reliability operation of Insulated gate bipolar transistors (IGBTs). Most monitoring methods focus on the package-related aging. Leakage current (Ileak) has been proposed as a potential chip-related aging… read more here.
Keywords: monitoring method; leakage current; aging monitoring; monitoring ... See more keywords