Genetic mapping of a major gene for leaf rust resistance in soft red winter wheat cultivar AGS 2000
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DOI: 10.1007/s11032-018-0909-8
Abstract: Leaf rust (LR), caused by Puccinia triticina (Pt), is a major disease of wheat worldwide. Genetic resistance is the most effective, economic, and environmentally safe method to reduce losses caused by LR. Seventy-nine LR resistance… read more here.
Keywords: cultivar; wheat; leaf rust; ags 2000 ... See more keywords