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Published in 2017 at "IEEE Transactions on Components, Packaging and Manufacturing Technology"
DOI: 10.1109/tcpmt.2017.2672700
Abstract: This paper presents an accurate and efficient on-wafer calibration algorithm of broadband scattering-parameter measurements for radio-frequency integrated circuit production test applications. Three on-chip calibration standards with the same probe positions as those of the devices…
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Keywords:
algorithm broadband;
calibration algorithm;
scattering parameter;
calibration ... See more keywords