An Alternative X-ray Diffraction Analysis for Comprehensive Determination of Structural Properties in Compositionally Graded Strained AlGaN Epilayers
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DOI: 10.1007/s13391-018-0074-6
Abstract: In this letter, a standard deviation based optimization technique has been applied on High Resolution X-ray Diffraction symmetric and asymmetric scan results to accurately determine the Aluminum molar fraction and lattice relaxation of Molecular Beam… read more here.
Keywords: compositionally graded; ray diffraction; diffraction analysis; determination ... See more keywords