The native oxide film on a model aluminium-copper alloy studied by XPS and ToF-SIMS
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DOI: 10.1016/j.corsci.2020.108837
Abstract: Abstract Surface analytical techniques were used to characterize the chemical composition and the thickness of the surface oxide on an AlCu2.2%at alloy sample. ToF-SIMS analyses show that the oxide layer is thinner on the intermetallic… read more here.
Keywords: native oxide; alloy; copper; tof sims ... See more keywords