Sign Up to like & get
recommendations!
1
Published in 2020 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2020.113584
Abstract: Abstract Analog circuits are often challenging to debug with dynamic laser stimulation (DLS) due to intrinsic sensitivity of some circuitries to carrier generations. This paper showcases successful post‑silicon debug on analog circuitries (start-up circuit) using…
read more here.
Keywords:
analog circuit;
dls analysis;
analysis analog;
dls ... See more keywords