Stability analysis of charge-controlled soft dielectric plates
Sign Up to like & getrecommendations! Published in 2020 at "International Journal of Engineering Science"
DOI: 10.1016/j.ijengsci.2020.103280
Abstract: This work is supported by a Government of Ireland Postgraduate Scholarship from the Irish Research Council (Project GOIPG/2016/712). We thank Giacomo Moretti, Yipin Su and Giuseppe Zurlo for most helpful inputs. read more here.
Keywords: charge controlled; analysis charge; stability analysis; soft dielectric ... See more keywords
Analysis on charge-retention characteristics of sub-threshold synaptic IGZO thin-film transistors with defective gate oxides
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DOI: 10.1038/s41598-024-62872-9
Abstract: We provide a quantitative analysis on the charge-retention characteristics of sub-threshold operating In–Ga–Zn–O (IGZO) thin-film transistors (TFTs) with a defective gate-oxide for low-power synaptic applications. Here, a defective SiO2 is incorporated as the synaptic gate-oxide… read more here.
Keywords: gate; retention characteristics; retention; characteristics sub ... See more keywords
Erratum: Analysis of Charge Order in the Kagome Metal AV_{3}Sb_{5} (A=K,Rb,Cs) [Phys. Rev. Lett. 127, 217601 (2021)].
Sign Up to like & getrecommendations! Published in 2022 at "Physical review letters"
DOI: 10.1103/physrevlett.128.099901
Abstract: This corrects the article DOI: 10.1103/PhysRevLett.127.217601. read more here.
Keywords: analysis charge; charge order; kagome metal; 127 217601 ... See more keywords