Atomic scale analysis of defect clustering and predictions of their concentrations in UO2+x
Sign Up to like & getrecommendations! Published in 2020 at "Journal of Nuclear Materials"
DOI: 10.1016/j.jnucmat.2020.152403
Abstract: Abstract The physical properties of uranium dioxide vary greatly with stoichiometry. Oxidation towards hyperstoichiometric UO2 − UO2+x – might be encountered at various stages of the nuclear fuel cycle if oxidative conditions are met; the impact of… read more here.
Keywords: defect clustering; physical properties; atomic scale; defect ... See more keywords
Analysis of Defect-Related Electrical Fatigue in 4H-SiC Avalanche Photodiodes
Sign Up to like & getrecommendations! Published in 2018 at "IEEE Photonics Technology Letters"
DOI: 10.1109/lpt.2018.2823706
Abstract: SiC-based avalanche photodiodes (APDs) are the preferred devices for use in high-sensitivity UV detectors. However, the defect densities on the surface or in the bulk of the SiC epitaxial layer limit the performance of APDs.… read more here.
Keywords: analysis defect; electrical fatigue; fatigue sic; avalanche photodiodes ... See more keywords